1st Edition

From Instrumentation to Nanotechnology

By J.W. Gardner Copyright 1992
    348 Pages
    by CRC Press

    Addressed to physical and chemical scientists and engineers, this book provides information on the design, manufacture, and assessment of components with critical dimensions or critical tolerances in the 0.1-100 nanometer range. Such tiny parts are now used in automobile engines, cassette players, and other common products. The 16 lectures presented are from an advanced vacation school on instrumentation and nanotechnology in Warwick, England, September 1990. Among the topics are signal processing, ultrasonic sensors, and nanoactuators for controlled displacements.

    .

    Introduction to the Series, Preface, List of Contributors, 1. Trends in Instrumentation and Nanotechnology 2. Signal Processing, 3. Correlation Methods Applied to Instrumentation, 4. Mathematical Modelling of Instruments - Application and Design, 5. Algorithms for Computer Aided Precision Metrology, 6. Ultrasonic Sensors, 7. Recent Advances in Solid-State Microsensors, 8. Nanotechnology, 9. Use of Energy Beams for Ultra-high Precision Processing of Materials, 10. Control of High Precision Instruments and Machines, 11. Optical Metrology: The Precision Measurement of Displacement Using Optical Interferometry, 12. Optical Diffraction for Surface Roughness Measurement, 13. Nanoparticle Visualization for Particle Image Velocimetry at Transionic Speeds, 14. High Precision Surface Profilometry: From Stylus to STM, 15. Nanoactuators for Controlled Displacements, 16. Calibration of Linear Transducers by X-ray Interferometry, Index

    Biography

    J.W. Gardner